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Photoelectric profilometer (2007BCEIA gold medal product)

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  • 产品名称:Photoelectric profilometer (2007BCEIA gold medal product)
  • 产品型号:WGL
  • 产品展商:Shanghai Jingke optical material
  • 产品文档:无相关文档
简单介绍

The instrument uses non-contact and optical phase-shifting interferometry to measure the surface of workpiece without damaging the workpiece surface. It can quickly measure the surface topography of v

产品描述

Characteristic:

The instrument adopts the non-contact, optical phase shift interferometry measurement does not damage the surface of the workpiece, the three-dimensional graphics can be quickly measured various kinds of workpiece surface topography, and calculated results. Suitable for measuring various gauge, optical components surface roughness; groove depth scale, dial; morphology of groove structure of coating thickness and coating boundary grating; magnetic (light) disk, magnetic head surface structure measurement; silicon wafer surface roughness and graphic structure measurement etc..
Because the instrument has high measuring accuracy, non-contact 3D measurement and characteristics, and using the computer control and fast analysis and calculation results, the utility model is suitable for all levels of testing, metrology research unit of industrial and mining enterprises, precision machining workshop, also applies to institutions of higher learning and scientific research units.


The main technical parameters


Rough surface micro depth measuring range

In a continuous surface, no more than two pixels between adjacent 1 / 4 wavelength: 1000 1nm height mutation

Contains between two adjacent pixels is greater than 1 / 4 wavelength: 130 1nm height mutation

The repeatability of measurement: Ra = 0.5nm

Magnification: 40X

Numerical aperture: 65

Working distance: 0.5mm

Visual instrument field: 0.25mm

Camera: 0.13 * 0.13MM

Visual magnification: 500 x

Camera (computer screen observation) a 2500 *

The receiver array measurement: 1000X1000

Pixel size: 5.2 x 5.2 M

The measurement time sampling (scanning) time: 1S

The mirror reflectivity instrument (high): ~ 50%

The reflectivity (low): ~ 4%

Lighting source: 6V incandescent lamp 5W

Green wavelength: lambda = 530nm interference filter

The half width is 10nm.

The main microscope lift: 110 mm

Working procedure: 5 "mm

The moving range of X, Y direction: ~ 10 mm

Worktable rotation range of motion: 360 degrees

Table inclined range: - 6 DEG

Computer system: P4, more than 2.8G, more than 1G of memory 17 inch flat screen display

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